Our plunger products for probes are recommended for the following customers!
Those who are promoting eco-friendly activities and are looking for an environmentally friendly plunger.
Those who are having difficulty finding a plunger with the specifications they want.
Those who are looking for a plunger with high conductivity or high thermal conductivity material.
Those who want to eliminate probe sharp edges.
Features of our probe products
Cold forging process of wire rods allows the material to be used without wasting, which is eco-friendly because it does not generate chips due to cutting process.
As process is using plastic deformation by pressuring material with the metal die, hating duration is extremely short and does not damage the characteristics of the material, so that mass quantity production is available
Since pressure is applied to the material in the mold to induce plastic deformation, heat generated by the process is extremely short-lived and does not damage the properties of the material, enabling mass production.
Image of forging process replacement from cutting
lineup
For wire probes
Partially flattened plunger
Specifications
Wire diameter
φ0.1mm~
Total length
2~60mm
Material
C2600
C2700
C5191
Others
Shape of flattened portion
Flat
Star
Tip shape
Needle flat
Plating
Ni base + Au
Packing form
Bag
Case
For Contact Probes
Header processing plunger
Specifications
Wire diameter
φ0.05mm~
Total length
2~20mm
Material
C2600
C2700
C5191
Others
Tip shape
Round
Flat
Round Flat
Needle Flat
Concave
Plating
Ni Base + Au
Packing form
Bag
case
Mid-flanged Plunger
Specifications
Wire diameter
φ0.05mm~
Total length
2~10mm
Material
C2600
C2700
C5191
Others
Mid-flanged
Single
Double
Tip shape
Flat
Earl Flat
Needle Flat
Plating
Ni base + Au
Packing form
bag
For Spring Connectors
For Spring Connectors
Specifications
Wire diameter
φ0.2mm~
Total length
1~6mm
Material
C2600
C2700
C5191
Others
Tip shape
Round
Plating
Ni base + Au
Packing form
bag
Tip Shape
Shape
Round
Needle Flat
Concave
Flat
Figure
Features
Suitable for inspection with less damage to vulnerable contact surfaces.
Suitable for inspection of fine contact points due to the narrow tip.
Suitable for inspection by contact with solder balls.
Inspection contact probe applications (spring probes, probe pins) Contact probes for inspection measuring machines and inspection sockets for various electronic components, semiconductor devices, printed circuit boards, etc.
Consumer and industrial products
Spring connector applications (pogo pins) Contact probes for inspection measuring machines and inspection sockets for smartphones, semiconductor devices, printed circuit boards, etc.
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