List of analytical instruments
We have introduced a variety of analyzers to maintain and manage quality.
In addition, we can also outsource various analysis operations, so please feel free to inquire.
Evaluation center (Analytical and analytical skills of trust)
< List of analytical instruments >
Equipment name | Abbreviation | Equipment manufacturer | Purpose of Use | |
---|---|---|---|---|
Analyzer | RF induction plasma emission spectrometer | ICP-AES | SHIMADZU | Quantitative Analysis of Elements in Solution Materials such as Acid, Aqueous Solution System and Organic Solvent System |
Atomic absorption spectrophotometer | AAS | SHIMADZU | Elemental quantitative analysis of solution materials such as acid, aqueous solution system and organic solvent system | |
Energy-dispersive X-ray fluorescence spectrometers | EDX | SHIMADZU | Quantitative analysis of elements in various materials forms such as metals, resins, powders, and liquids | |
Scanning electron microscopy (SEM) | SEM | JEOL | Metals, Semiconductors, Ceramics, Minerals and Other Surfaces: Analysis and Quantitative Analysis | |
Fourier transform infrared spectrophotometer | FT-IR | SHIMADZU | Surface foreign matter analysis and structural estimation of organic compounds (qualitative) | |
All-Organic Carbon Meter (High Sensitivity Type) | TOC | SHIMADZU | Quantitative Analysis as Total Organic Carbon Content of Liquid, Solid Surface | |
Spectrophotometer (ultraviolet-visible) | UV-VIS | SHIMADZU | Quantitative analysis of mainly liquid data | |
Environmental load equipment | Temperature (cryogenic) impact tester | Espec | Thermal shock tester (Environmental deterioration evaluation tester) | |
Long Accelerated Life Tester | Pressure cooker | Hirayama Manufacturing | Evaluation of moisture resistance of resin-sealed electronic components, etc. | |
Constant temperature high temperature dryer | EYELA | Maximum temperature 250°C (natural convection type) | ||
Constant temperature bath | Espec | Heat resistance test and material deterioration test | ||
Measuring instrument | Energy dispersive X-ray fluorescence film thickness measuring device | X-ray Fluorescence Film Thickness Analyzer | Hitachi High-Tech Science | Measurement of film thickness of known elements such as plating film |
Micro Vickers hardness meter | Akashi | Characterization of hardness mainly on metal surfaces and cross-sections | ||
Precision universal testing machine | Autograph | SHIMADZU | Strength Characterization of Metal Materials, Polymer Materials, etc. | |
Solder checker | RHESCA | Solder wettability evaluation | ||
Microscope | KEYENCE | Surface analysis of metals, semiconductors, ceramics, minerals, etc. | ||
Cross-sectional material making apparatus | CP | JEOL | Precision cross-sectional processing of metals, semiconductors, ceramics, minerals, etc. | |
Compressive tensile tester | EMX | Imada | Force gauge; 200N, 500N | |
Height, flatness measuring instrument | HM-1200 | KEYENCE | ||
Stereomicroscope | Olympus | |||
Measuring microscope | Nikon | |||
Automatic measuring equipment | Image-measuring NEXIV | Nikon | ||
Projector | Nikon | |||
Glossmeter | Nippon Denshoku Industries | |||
Electronic scale | Shinko Denshi |
Notes: 1) If a large number of equipment are owned, representative equipment is listed.
Notes: 2) Excluding loupe, caliper, micrometer, reference instrument, gauge, etc.